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Dynetics, an employee-owned company, is seeking a talented Senior Scanning Electron Microscopy/Focused Ion Beam Research Engineer to help create unique solutions for complex problems. With offices across the United States engaging in the defense, space, cyber and commercial fields, Dynetics provides responsive, cost-effective engineering, scientific and IT solutions.
A successful candidate will work closely with a highly technical, multidisciplinary team consisting of scientists and engineers to perform hands-on preparation, measurement, and characterization of various semiconductor materials and devices for SEM/FIB analysis efforts. The candidate will be expected to develop and execute test and measurement plans and methodologies related to SEM/FIB-based integrated circuit analysis and characterization. Responsibilities include, but are not limited to, data collection and analysis, preparation of measurement/analysis reports, and presentation of findings to stakeholders.
A Bachelor's Degree or higher in Physics, Materials Science, or Electrical Engineering with 10+ years of relevant experience in the semiconductor industry and SEM/FIB operation for semiconductor device and integrated circuit analysis.
Candidate must be a resident of the North Alabama area or willing to relocate to the Huntsville - North Alabama, AL area.
An ideal candidate would posess the following skills:
An advanced knowledge of focused ion beam systems. This includes advanced usage and basic maintenance, as well as experience with relevant chemistries and recipes for integrated circuit analysis.
Knowledge of semiconductor device physics, and the use of tools intended to characterize semiconductor devices and circuits.
Candidate must be a US Citizen and possess (as well as maintain) a Final Top Secret/SSBI Clearance.